Magnetic force microscopy is a technique for imaging of magnetic field spatial distributions on the sample surface.
MFM is used for the study of magnetic structure of sample with sub-micron resolution.
This equipment is using two-pass measurement scheme.
The following procedure is performed during the process of scanning.
Surface topography of the scanning line is determined in the first pass in semi-contact mode, then the probe is lifted bove the surface.
In second pass the probe is moved along the First pass direction but different height.