Magnetic force microscopy is a technique for imaging of magnetic field spatial distributions on the sample surface.

MFM is used for the study of  magnetic structure of sample with sub-micron resolution.

This equipment is using two-pass measurement scheme.

The following procedure is performed during the process of scanning.

Surface topography of the scanning line is determined in the first pass  in semi-contact mode, then the probe is lifted bove the surface.

In second pass the probe is moved along the First pass direction but different height.